Single Crystal Orientation

Single Crystal Orientation


The LAUE film camera, employed in back-reflection methodry, is used to determine the crystallographic orientation of single crystal axes with respect to distinct sample features, such as a surface, a sample edge or center line. A large variety of sample stages allows a minimum sample size on the order of a few square millimeters and a maximum size limited only by weight (10+ lbs).

Samples lacking any distinct features or possessing unfavorable surface orientation can be realigned to virtually any crystallopgrahic direction [uvw] or lattice pole [hkl]. The results of the initial analysis provide the adjustments necessary for reorientation of the sample stage. The reoriented surface is produced by either polishing or cutting, depending on the sample size and the accuracy desired. Candidates of reorientation include seeds for crystal growth and single crystals whose physical properties are to be determined in selected crystallographic directions.

 

Indexed LAU back-reflection photograph.
Indexed LAUE back-reflection photograph from a Lu2SiO5 single crystal taken with unfiltered Mo-radiation at 35kV/10mA.
 
Space Group
a
b
c
β
I/2c (15)
Z = 8 (monoclinic)
12.36 Ĺ
6.64 Ĺ
10.24 Ĺ
102.40°
Computer generated Wulff net.
Computer generated Wulff net with stereographic projection of the LAUE pattern to the left. The nominal orientation of the surface normal is parallel to the [502] lattice pole. Note the two-fold symmetry along the horizontal axis.
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CAMET Research, Inc.
An X-Ray Diffraction (XRD) Laboratory
6409 Camino Vista #F, Goleta, CA 93117, USA
Phone: (805) 685-1665
Fax: (805) 685-9082
E-mail: camet@camet-lab.com
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